Back to RF and Microwave Engineering  |  Previous paper  |  Next paper

Visible Spectral Reflectance Analysis in a Metal-Insulator-Metal (MIM) Multilayer with COMSOL Multiphysics


Y. Oshikane1 K. Murai1
1Osaka University, Suita City, Osaka, Japan


EM simulation in an MIM structure.

We are developing a reflective metal-insulator-metal (MIM) filter with narrow band absorption. In the MIM structure, the interaction between subwavelength multilayer and visible light, and the resultant surface plasmon resonance (SPR) in specific illumination conditions must be understood. Such electromagnetic field interactions have been analysed using COMSOL Multiphysics and RF Module.

Share it on Social Media: