Computational Analysis of the Mechanical and Thermal Stresses in a Thin Film PProDOT-Based Redox Capacitor

J. Sotero-Esteva[1], M. Rosario-Canales[2], P. Gopu[3], and J. Santiago-Avilés[3]

[1]Department of Mathematics, University of Puerto Rico at Humacao, Humacao, PR
[2]Department of Chemistry, University of Pennsylvania, Philadelphia, PA, USA
[3]Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA

Among the several types of capacitors, the double-layer and redox types have gathered increasing attention to address some of the heavy power demands of modern technology. In redox capacitors, charge is stored chemically via oxidation/reduction processes in the active materials like electroactive polymers (EAPs) or metal oxides. This work investigates the stresses and heat flux of the electrode – separator membrane interaction in a thin film redox capacitor at scales under a micrometer.

COMSOL Multiphysics was used to model the electrode. Results show significant stresses and deformations occurring in the PProDOT-based electrodes as well as temperature variations that provide a plausible explanation for the abrasion phenomena.

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