Deposition of Aerosol Particles in Electronic Devices

M. Olin [1], L. Laakso [1], J. Hannula [2], T. Galkin [2], and K. Väkeväinen [2]
[1] University of Helsinki, Finland
[2] Nokia Corporation, Finland

Small electronic devices are nowadays used in varying conditions, which expose them to stresses. One part of this stress is related to transport of potentially harmful chemical substances into small mechanical structures of devices, which happens by molecular diffusion and advection by air flow.

We have applied a simplified contamination model, whose parameters, though, are estimated by numerical modelling of fine particle transport inside an example internal structure.

We observed that it is possible to calculate the needed parameters and that those parameters showed maximum mobility for particles of diameter varying from about 50 to 500 nm.

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