Computational Analysis of the Mechanical and Thermal Stresses in a Thin Film PProDOT-Based Redox CapacitorJ. Sotero-Esteva, M. Rosario-Canales, P. Gopu, and J. Santiago-Avilés
Department of Mathematics, University of Puerto Rico at Humacao, Humacao, PR
Department of Chemistry, University of Pennsylvania, Philadelphia, PA, USA
Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA
Among the several types of capacitors, the double-layer and redox types have gathered increasing attention to address some of the heavy power demands of modern technology. In redox capacitors, charge is stored chemically via oxidation/reduction processes in the active materials like electroactive polymers (EAPs) or metal oxides. This work investigates the stresses and heat flux of the electrode – separator membrane interaction in a thin film redox capacitor at scales under a micrometer.
COMSOL Multiphysics was used to model the electrode. Results show significant stresses and deformations occurring in the PProDOT-based electrodes as well as temperature variations that provide a plausible explanation for the abrasion phenomena.
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