Note that while COMSOL employees may participate in the discussion forum, COMSOL® software users who are on-subscription should submit their questions via the Support Center for a more comprehensive response from the Technical Support team.
-
Amorphous Silicon under electron impact: in-bulk electron-hole pair formation, and secondary electron emission (SEE)
read2 Replies 259 ViewsVersion 5.3 Low-Frequency ElectromagneticsCharged Particle TracingPlasma Physics
Jonathan Thomet posted 7 years ago reply 7 years ago by Jonathan Thomet
-
0 Replies 185 Views
Version 5.3 ElectromagneticsCharged Particle TracingSemiconductor Devices
-
0 Replies 71 Views
Version 5.3a MEMS & NanotechnologyMEMS & Piezoelectric DevicesStructural Mechanics
Nabeel Khan posted 7 years ago
-
2 Replies 220 Views
Version 5.3a Structural & AcousticsGeometryStructural Mechanics
Rishav Aryal posted 7 years ago reply 7 years ago by Rishav Aryal
-
0 Replies 70 Views
General
Lauren Sansone posted 7 years ago
-
0 Replies 124 Views
Version 5.3a ChemicalBattery DesignParameters, Variables, & Functions
Daniel Schanbacher posted 7 years ago
-
0 Replies 365 Views
Version 5.2a GeneralCluster & Cloud Computing
Aditya Saurabh posted 7 years ago
-
2 Replies 196 Views
Vartika Parihar posted 7 years ago reply 7 years ago by Sohan Birla
-
Accessing Uplus and Yplus values and also determining Wall shear stress value in a turbulent channel flow.
read0 Replies 658 ViewsVersion 5.0 Computational Fluid Dynamics (CFD)
Lakshmi Narasiman Vijayasarathi posted 7 years ago
-
1 Replies 415 Views
Shantharama Bhat posted 7 years ago reply 7 years ago by Mickaël Barsive
