The Application Gallery features COMSOL Multiphysics® tutorial and demo app files pertinent to the electrical, structural, acoustics, fluid, heat, and chemical disciplines. You can use these examples as a starting point for your own simulation work by downloading the tutorial model or demo app file and its accompanying instructions.
Search for tutorials and apps relevant to your area of expertise via the Quick Search feature. Note that many of the examples featured here can also be accessed via the Application Libraries that are built into the COMSOL Multiphysics® software and available from the File menu.
A radio frequency quadrupole ion trap utilizes a radio frequency quadrupole (RFQ) in order to trap an ion beam. A continuous high energy ion beam is first cooled and converted into a spatially confined bunch, which can then be released with minimal heating of the beam. The device is also ... Read More
A quadrupole mass filter (QMF) is a key component of a modern mass spectrometer. A QMF uses direct current (DC) and alternating current (AC) electric fields to analyze positive or negative ions by mass to charge ratio. A QMF consists of 4 parallel rods spaced equidistantly, the ratio of ... Read More
When modeling the propagation of charged particle beams at high currents and relativistic speeds, the space charge and beam current create significant electric and magnetic forces that tend to expand and focus the beam, respectively. The Charged Particle Tracing interface uses an ... Read More
The principle component of a quadrupole mass spectrometer is the mass filter which is used to filter ions with different charge to mass ratios. The quadrupole mass filter has been well studied over the years, Ref. 1 and the physics and optimal design are well understood. In a real ... Read More
An electrodynamic ion funnel provides an efficient means of transferring ions from regions of high pressure to high vacuum. The ion funnel can couple devices which generally operate at pressures of different orders of magnitude, such as ion mobility spectrometers and mass spectrometers, ... Read More
A scanning electron microscope samples images by scanning a target with a high-energy beam of electrons. The subsequent electron interactions produce signals such as secondary and back-scattered electrons that contain information about the sample surface topography. Electromagnetic ... Read More
Ion beam etching is a critical technique widely used in semiconductor manufacturing, materials science, and microelectromechanical systems (MEMS). This proof-of-concept model simulates argon ion sputtering of a silicon surface using the Charged Particle Tracing interface. A Deformed ... Read More
When modeling the propagation of charged particle beams at high currents, the space charge force generated by the beam significantly affects the trajectories of the charged particles. Perturbations to these trajectories, in turn, affect the space charge distribution. The Charged ... Read More
An Einzel lens is an electrostatic device used for focusing charged particle beams. It may be found in cathode ray tubes, ion beam and electron beam experiments, and ion propulsion systems. This particular model consists of three axially aligned cylinders. The outer cylinders are ... Read More
The drift velocity of Ar+ is calculated using a Monte Carlo simulation in which the elastic collisions of Argon ions with ambient neutrals are explicitly modeled. The model uses energy-dependent collision cross-section data from experiment. The average ion velocity values are consistent ... Read More
