Sensitive High-Resolution Ion Microprobe
Application ID: 30641
This tutorial utilizes the Particle Beam feature to examine the performance of a high-precision spectrometer. An ion beam is subjected to electric and magnetic forces, and only a fraction of the incoming beam is transmitted to the detector. The Particle Counter feature is used to compute the transmission probability, and to visualize the nominal trajectory of the transmitted beam.
This model example illustrates applications of this type that would nominally be built using the following products:
however, additional products may be required to completely define and model it. Furthermore, this example may also be defined and modeled using components from the following product combinations:
The combination of COMSOL® products required to model your application depends on several factors and may include boundary conditions, material properties, physics interfaces, and part libraries. Particular functionality may be common to several products. To determine the right combination of products for your modeling needs, review the Specification Chart and make use of a free evaluation license. The COMSOL Sales and Support teams are available for answering any questions you may have regarding this.