Sensitive High-Resolution Ion Microprobe

Application ID: 30641

This tutorial utilizes the Particle Beam feature to examine the performance of a high-precision spectrometer. An ion beam is subjected to electric and magnetic forces, and only a fraction of the incoming beam is transmitted to the detector. The Particle Counter feature is used to compute the transmission probability, and to visualize the nominal trajectory of the transmitted beam.

This model example illustrates applications of this type that would nominally be built using the following products: