Study of a Defective Microstrip Line via Frequency-to-Time FFT Analysis

Application ID: 67361

While transient analyses are useful for time domain reflectometry (TDR) to handle signal integrity (SI) problems, many RF and microwave examples are addressed using frequency domain simulations generating S-parameters. However, from the frequency domain data it is difficult to identify sources for this signal degradation. This example simulates a microstrip line in frequency domain with a couple of line width discontinuities and performs frequency-to-time fast Fourier transform. The computed results help to identify the physical discontinuities and impedance mismatches on the transmission line, by analyzing the signal fluctuation in the time domain.

This model example illustrates applications of this type that would nominally be built using the following products: