Thin Layer Chronoamperometry

Application ID: 14423

The common electroanalytical method of exhaustive amperometric detection in a microscopic thin layer is modelled as a 1D-symmetric diffusion problem. The simulated result agrees with the analytical Cottrell equation at short times, and deviates as expected at long times when the diffusion layer spans the thin layer cell.

This model example illustrates applications of this type that would nominally be built using the following products: